Correlation of Process-Induced Defects and Detectability Models for Laser-Wire AM

馃嚭馃嚫

SAM

80NSSC26937339Q 路 NAICS 611310 路 United States (federal) 路 New

Organization
NASA SHARED SERVICES CENTER
Posted
Jul 9, 2026
Response due
Jul 13, 20263 days left
Type
Solicitation
PSC
B599

Point of contact

Name
Cody Guidry
Email
cody.d.guidry@nasa.gov
Type
primary

Documents & attachments

Correlation of Process-Induced Defects and Detectability Models for Laser-Wire AM | SAM | Vourix 路 Vourix