CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation

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SAM·sam·United States (federal)
federalNew

Solicitation

1333ND26QNB030236

NAICS

334519

Organization

COMMERCE, DEPARTMENT OF.NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY.DEPT OF COMMERCE NIST

Posted

Jun 16, 2026

Response due

Jun 29, 202612 days left

Type

Combined Synopsis/Solicitation

Classification / PSC

6640

Place of performance

Gaithersburg, Maryland 20899 UNITED STATES

Point of contact

Name (1)
Tracy Retterer
Email (1)
Tracy.retterer@nist.gov
Type (1)
primary
Name (2)
Donald Collie
Email (2)
donald.collie@nist.gov
Type (2)
secondary
CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation | SAM | Vourix · Vourix